This question was closed without grading. Reason: Answer found elsewhere
Aug 4, 2023 10:53
10 mos ago
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Italian term
derive
Italian to English
Tech/Engineering
Mechanics / Mech Engineering
eliminare possibili derive in acquisizione
"Derive" in questo contesto significa qualcosa come "errori", "scostamenti dalla realtà"
"Derive" in questo contesto significa qualcosa come "errori", "scostamenti dalla realtà"
Reference comments
5 hrs
Reference:
eliminate (control?) possible drift in acquisition of scanned image
Forse vedere (electron microscope may be relewant)
researchgate.net/publication/281852637_Correction_of_image_drift_and_distortion_in_a_scanning_electron_microscopy
Continuous research on small-scale mechanical structures and systems has attracted strong demand for ultrafine deformation and strain measurements. Conventional optical microscope cannot meet such requirements owing to its lower spatial resolution. Therefore, high-resolution scanning electron microscope has become the preferred system for high spatial resolution imaging and measurements. However, scanning electron microscope usually is contaminated by *distortion and drift aberrations* which cause serious errors to precise imaging and measurements of tiny structures.
.mdpi.com/2076-3417/9/19/4093 However, a very relevant number of applications on the ground benefit from the capability of a sensor to capture the complete 3D information around a vehicle. Thus, still using time-counting of different events in light, first research-based, then commercial 3D cameras started to become available, and rapidly found applications in audiovisual segmentation [9], RGB+depth fusion [10], 3D screens [11], people and object detection [12] and, of course, in human-machine interfaces [13], some of them reaching the general consumer market, being the best-known example the Microsoft Kinect [14]. These commercial units were in almost all cases amplitude-modulated cameras where the phase of the emitted light was compared with the received one in order to compare their phase difference to estimate distance.
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Note added at 1 day 5 hrs (2023-08-05 16:19:31 GMT)
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links https://www.researchgate.net/publication/281852637_Correctio...
https://www.mdpi.com/2076-3417/9/19/4093
researchgate.net/publication/281852637_Correction_of_image_drift_and_distortion_in_a_scanning_electron_microscopy
Continuous research on small-scale mechanical structures and systems has attracted strong demand for ultrafine deformation and strain measurements. Conventional optical microscope cannot meet such requirements owing to its lower spatial resolution. Therefore, high-resolution scanning electron microscope has become the preferred system for high spatial resolution imaging and measurements. However, scanning electron microscope usually is contaminated by *distortion and drift aberrations* which cause serious errors to precise imaging and measurements of tiny structures.
.mdpi.com/2076-3417/9/19/4093 However, a very relevant number of applications on the ground benefit from the capability of a sensor to capture the complete 3D information around a vehicle. Thus, still using time-counting of different events in light, first research-based, then commercial 3D cameras started to become available, and rapidly found applications in audiovisual segmentation [9], RGB+depth fusion [10], 3D screens [11], people and object detection [12] and, of course, in human-machine interfaces [13], some of them reaching the general consumer market, being the best-known example the Microsoft Kinect [14]. These commercial units were in almost all cases amplitude-modulated cameras where the phase of the emitted light was compared with the received one in order to compare their phase difference to estimate distance.
--------------------------------------------------
Note added at 1 day 5 hrs (2023-08-05 16:19:31 GMT)
--------------------------------------------------
links https://www.researchgate.net/publication/281852637_Correctio...
https://www.mdpi.com/2076-3417/9/19/4093
Reference:
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